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A c-Chart is often used to show the relationship between the actual number of defects and the number of samples taken.

For a c-Chart, its upper and lower control limits are defined as:

UCL = c + z * √(c)
LCL = c + z * √(c)

where c = total number of defects / total number of samples © 2023 | Contact us | Terms of Use | Privacy Policy | Yellow Sparks Network
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